Crystal Frequency, Mass and Resistance Measurement
RQCM is a highly advanced method of measuring film properties during processes such as deposition, dissolution or permeation. Up to three crystals can be measured simultaneously with <0.4 ng/cm 2 mass resolution. All data is logged and graphically displayed using integrated Windows-based software in real time.
Features at a Glance
- Measures up to three crystals simultaneously
- <0.4 ng/cm 2 measurement resolution
- Frequency range: 3.8 to 6 MHz, 5.1 to 10 MHz
- Supports heavily loaded crystals
- Capacitance cancellation
- Electrically isolated crystal electrode
- Onboard data acquisition
- Control inputs and outputs
- Integrated Windows-based software included
ASSOCIATED TECHNICAL INFORMATION
Brochures and Datasheets:
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Brochure - Maxtek Crystal Holders/Flow Cell/Glass Cell
English
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Brochure - Maxtek RQCM Quartz Crystal Microbalance Research System
English
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Operations and Maintenance Manuals:
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Instruction Sheet - How to Install a Crystal
English
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Instruction Sheet - Probe Maintenance
English
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Maintenance and Installation Manual - CHC-15 Crystal Holders, GC-15 Glass Cell Cell
English
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Operating Manual - RQCM Quartz Crystal Microbalance Research System
English
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Software:
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Software - RQCM_DATALOGGER_V2.0.3
English
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Technical Information:
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Technical Note - RQCM Software; Run-Time Error '35603': Invalid Key
English
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Technical Note: Communications Checklist - RS-232
English
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Technical Note: Dynamically Adjusted Measurement Update Rate
English
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 | | Real-Time Crystal Frequency, Mass and Resistance Measurement |
|  | | Table of Density and Acoustic Values |
|  | | GC-15 Glass Cell Well-suited for QCM experiments |
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